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Anales de la Academia de Ciencias de Cuba

versión On-line ISSN 2304-0106

Resumen

INFANTE ABREU, Marta Beatriz et al. Technology surveillance model based on patterns associated with critical factors and its applications. Anales de la ACC [online]. 2022, vol.12, n.1  Epub 11-Abr-2022. ISSN 2304-0106.

Introduction:

The limited structuring of available knowledge on the practices and references of Technological Surveillance (TS) in dissimilar contexts, the diversity of management objectives, the opportunities offered by the social web technologies,and the growing demands of Cuban organizations for knowledge generation in order to implementthe Guidelines of the Economic and Social Policy constitute motivations for searching standardized alternatives of TS, guaranteeing its generalization. The scientific problem is: the existing TS references lack a standardized structure that allows them to be comparable and its generalization for applications of different complexities, limiting the capabilities generation in organizations to find the required knowledge for the solution of dissimilar needs and objectives. The hypothesis of the research is that a TS model based on social web technologies and patterns associated with the TS’s Critical Factors (CF) will allow to generate and systematically increase TS capabilities according to objectives and scenarios of use supported. . The general objective is to design a TS model based on patterns associated with CF, verifying its usefulness and usability.

Methods:

The TS Model based on patterns associated with CF, called MOVTUP, is conceptualized by definitions, scope, objectives, principles; the model has four procedures to: generate patterns; implement TS patterns in usage scenarios; provide feedback and improve the pattern catalog; to establish support with social web technologies.

Results:

The MOVTUP was approved by groups of experts, compared with 61 references, verified in 30 case studies, validating that it allows generating and increasing TS capabilities, demonstrating its usefulness and usability.

Palabras clave : technology surveillance; patterns; critical factors; applications.

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