Meu SciELO
Serviços Personalizados
Artigo
Indicadores
- Citado por SciELO
Links relacionados
- Similares em SciELO
Compartilhar
Ingeniería Electrónica, Automática y Comunicaciones
versão On-line ISSN 1815-5928
Resumo
GUILLERMO ZOLA, Julio e PACHECO, Gonzalo Andrés. Transmision Line Pulse (TLP): Correlation with Electrostatic Discharge Models (ESD). EAC [online]. 2012, vol.33, n.3, pp. 37-48. ISSN 1815-5928.
There are several models which try to describe the waveforms and damage produced by an electrostatic discharge event ESD- to an integrated circuit IC-. The Transmission Line Pulse TLP- test is widely used to run tests in this field, so it is needed to keep close correlation to the models used in different standards, in order to validate its results. This work analyzes the search of an approximate correlation, through tests, measurements and PSpice simulation, in order to predict, through the use of TLP information, the results of applying different standard ESD waveforms to a Device Under Test DUT-.
Palavras-chave : correlation; ESD; SPICE; TLP.