SciELO - Scientific Electronic Library Online

 
 número41Cálculo de distribuciones de desplazamientos atómicos en materiales sólidosEstudio del efecto de la radiación gamma en elvalor medio del número de grupos etoxiLados del surfactante Tritón X-100 índice de autoresíndice de materiabúsqueda de artículos
Home Pagelista alfabética de revistas  

Servicios Personalizados

Revista

Articulo

Indicadores

  • No hay articulos citadosCitado por SciELO

Links relacionados

  • No hay articulos similaresSimilares en SciELO

Compartir


Nucleus

versión impresa ISSN 0864-084X

Resumen

LEYVA FABELO, Antonio et al. Calculation of the displacement cross sections and the dpa distribution in hydrogenated amorphous silicon semiconductors detectors in medical digital imaging applications. Nucleus [online]. 2007, n.41, pp.45-49. ISSN 0864-084X.

In present paper the dependence of the displacement cross sections of the different species of atoms in the a-Si:H structure, with the energy of the secondary electrons generated by the X-rays of the typical energies using in medical imaging applications, was calculated using the Mott-McKinley-Feshbach approach. It was verified that for electron energies higher than 1.52 keV it is possible the occurrence of hydrogen atoms displacements, while for the silicon atoms the threshold energy is 126 keV. These results were compared with those obtained for similar detectors but developed with crystalline silicon. With the use of the mathematical simulation of the radiation transport in the matter, the energy spectrum of the secondary electrons was calculated in order to estimate the number of atomic displacements, which take place in the semiconducting amorphous device in working regime. The spatial distribution of the dpa in the detectors volume, as well as its behavior with the depth in the work region are presented and discussed in the text.

Palabras clave : cross sections; atomic displacements; semiconductor detectors; simulation; amorphous states; silicon, x radiation; images.

        · resumen en Español     · texto en Español     · Español ( pdf )