<?xml version="1.0" encoding="ISO-8859-1"?><article xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance">
<front>
<journal-meta>
<journal-id>1815-5901</journal-id>
<journal-title><![CDATA[Ingeniería Energética]]></journal-title>
<abbrev-journal-title><![CDATA[Energética]]></abbrev-journal-title>
<issn>1815-5901</issn>
<publisher>
<publisher-name><![CDATA[Universidad Tecnológica de La Habana José Antonio Echeverría, Cujae]]></publisher-name>
</publisher>
</journal-meta>
<article-meta>
<article-id>S1815-59012022000200060</article-id>
<title-group>
<article-title xml:lang="es"><![CDATA[Electroluminiscencia de módulos de silicio policristalino]]></article-title>
<article-title xml:lang="en"><![CDATA[Electroluminiscence of silicon polycrystalline modules]]></article-title>
</title-group>
<contrib-group>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Benavides Esteva]]></surname>
<given-names><![CDATA[Josué]]></given-names>
</name>
<xref ref-type="aff" rid="Aff"/>
</contrib>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Díaz Suárez]]></surname>
<given-names><![CDATA[René]]></given-names>
</name>
<xref ref-type="aff" rid="Aff"/>
</contrib>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Roig Rassi]]></surname>
<given-names><![CDATA[Alina]]></given-names>
</name>
<xref ref-type="aff" rid="Aff"/>
</contrib>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Vaillant Roca]]></surname>
<given-names><![CDATA[Lídice]]></given-names>
</name>
<xref ref-type="aff" rid="Aff"/>
</contrib>
</contrib-group>
<aff id="Af1">
<institution><![CDATA[,Universidad de La Habana Instituto de Ciencia y Tecnología de Materiales - Facultad de Física Laboratorio de Investigaciones Fotovoltaicas]]></institution>
<addr-line><![CDATA[La Habana ]]></addr-line>
<country>Cuba</country>
</aff>
<aff id="Af2">
<institution><![CDATA[,Centro de Gestión de Información y Desarrollo de la Energía. CUBAENERGÍA  ]]></institution>
<addr-line><![CDATA[ ]]></addr-line>
<country>Cuba</country>
</aff>
<pub-date pub-type="pub">
<day>00</day>
<month>08</month>
<year>2022</year>
</pub-date>
<pub-date pub-type="epub">
<day>00</day>
<month>08</month>
<year>2022</year>
</pub-date>
<volume>43</volume>
<numero>2</numero>
<fpage>60</fpage>
<lpage>69</lpage>
<copyright-statement/>
<copyright-year/>
<self-uri xlink:href="http://scielo.sld.cu/scielo.php?script=sci_arttext&amp;pid=S1815-59012022000200060&amp;lng=en&amp;nrm=iso"></self-uri><self-uri xlink:href="http://scielo.sld.cu/scielo.php?script=sci_abstract&amp;pid=S1815-59012022000200060&amp;lng=en&amp;nrm=iso"></self-uri><self-uri xlink:href="http://scielo.sld.cu/scielo.php?script=sci_pdf&amp;pid=S1815-59012022000200060&amp;lng=en&amp;nrm=iso"></self-uri><abstract abstract-type="short" xml:lang="es"><p><![CDATA[RESUMEN Se presenta la técnica de electroluminiscencia que permite realizar análisis cualitativos de la condición del módulo fotovoltaico, aplicada a la caracterización de módulos fotovoltaicos de silicio bajo distintas condiciones. Se detallan las ventajas y el rango de aplicabilidad de la técnica en dependencia del entorno en el cual se haga, las especificaciones técnicas de la cámara de electroluminiscencia y la metodología que se llevó a cabo para las caracterizaciones. Se presentan los resultados de la implementación de la técnica tanto en condiciones de laboratorio como en un sistema fotovoltaico instalado sobre cubierta. Como resultado de la aplicación de la técnica de electroluminiscencia se detectaron defectos como celdas con importantes roturas y micro-fracturas, desconexiones entre celdas; corrosión y fallas a lo largo de los contactos metálicos del módulo ocasionados por tensiones en los puntos de soldadura. Las micro-fracturas y las roturasson mucho más frecuentes que el resto de fallas detectadas mediante la electroluminiscencia.]]></p></abstract>
<abstract abstract-type="short" xml:lang="en"><p><![CDATA[ABSTRACT The electroluminescence technique is presented, which allows qualitative analysis of the condition of the photovoltaic module, applied to the characterization of silicon photovoltaic modules under different conditions. The advantages and the range of applicability of the technique are detailed depending on the environment in which it is done, the technical specifications of the electroluminescence camera and the methodology that was carried out for the characterizations. The results of the implementation of the technique both in laboratory conditions and in a photovoltaic system installed on a roof were presented. Defects were detected such as cells with significant breaks and microcracks; disconnections between cells; corrosion and shunt failures along the fingers caused by stresses in the welding points. Microcracks and breaks are much more frequent than the rest of the faults detected by electroluminescence.]]></p></abstract>
<kwd-group>
<kwd lng="es"><![CDATA[Electroluminiscencia]]></kwd>
<kwd lng="es"><![CDATA[módulo de silicio]]></kwd>
<kwd lng="es"><![CDATA[defectos]]></kwd>
<kwd lng="en"><![CDATA[Electroluminiscence]]></kwd>
<kwd lng="en"><![CDATA[silicon module]]></kwd>
<kwd lng="en"><![CDATA[failures]]></kwd>
</kwd-group>
</article-meta>
</front><back>
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