<?xml version="1.0" encoding="ISO-8859-1"?><article xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance">
<front>
<journal-meta>
<journal-id>1815-5901</journal-id>
<journal-title><![CDATA[Ingeniería Energética]]></journal-title>
<abbrev-journal-title><![CDATA[Energética]]></abbrev-journal-title>
<issn>1815-5901</issn>
<publisher>
<publisher-name><![CDATA[Universidad Tecnológica de La Habana José Antonio Echeverría, Cujae]]></publisher-name>
</publisher>
</journal-meta>
<article-meta>
<article-id>S1815-59012022000300090</article-id>
<title-group>
<article-title xml:lang="es"><![CDATA[Modos y mecanismos de falla de LEDs empleados en iluminación]]></article-title>
<article-title xml:lang="en"><![CDATA[Failure modes and failure mechanisms of LEDs used in lighting]]></article-title>
</title-group>
<contrib-group>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Fernández Labrada]]></surname>
<given-names><![CDATA[Diego de los Ángeles]]></given-names>
</name>
<xref ref-type="aff" rid="Aff"/>
</contrib>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Guerra Blanco]]></surname>
<given-names><![CDATA[Ernesto Alejandro]]></given-names>
</name>
<xref ref-type="aff" rid="Aff"/>
</contrib>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Castro Fernandez]]></surname>
<given-names><![CDATA[Miguel]]></given-names>
</name>
<xref ref-type="aff" rid="Aff"/>
</contrib>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Céspedes Fernández]]></surname>
<given-names><![CDATA[Alexander]]></given-names>
</name>
<xref ref-type="aff" rid="Aff"/>
</contrib>
</contrib-group>
<aff id="Af1">
<institution><![CDATA[,Universidad Tecnológica de La Habana José A. Echeverría  ]]></institution>
<addr-line><![CDATA[La Habana ]]></addr-line>
<country>Cuba</country>
</aff>
<aff id="Af2">
<institution><![CDATA[,Universidad del Valle  ]]></institution>
<addr-line><![CDATA[Cali Valle del Cauca]]></addr-line>
<country>Colombia</country>
</aff>
<pub-date pub-type="pub">
<day>00</day>
<month>12</month>
<year>2022</year>
</pub-date>
<pub-date pub-type="epub">
<day>00</day>
<month>12</month>
<year>2022</year>
</pub-date>
<volume>43</volume>
<numero>3</numero>
<fpage>90</fpage>
<lpage>98</lpage>
<copyright-statement/>
<copyright-year/>
<self-uri xlink:href="http://scielo.sld.cu/scielo.php?script=sci_arttext&amp;pid=S1815-59012022000300090&amp;lng=en&amp;nrm=iso"></self-uri><self-uri xlink:href="http://scielo.sld.cu/scielo.php?script=sci_abstract&amp;pid=S1815-59012022000300090&amp;lng=en&amp;nrm=iso"></self-uri><self-uri xlink:href="http://scielo.sld.cu/scielo.php?script=sci_pdf&amp;pid=S1815-59012022000300090&amp;lng=en&amp;nrm=iso"></self-uri><abstract abstract-type="short" xml:lang="es"><p><![CDATA[RESUMEN Debido al incremento del uso de los LEDs en los sistemas de iluminación, la evaluación de la confiabilidad de estos, constituye un tema de vital importancia en el sector de la iluminación, y por consiguiente, la comprensión de sus mecanismos y modos de falla también lo es. Aunque el proceso de construcción de los LEDs es similar a otros dispositivos microelectrónicos existen materiales y requisitos funcionales en estos que hacen que sus modos y mecanismos de fallo sean diferentes. En este trabajo se presenta una revisión de las investigaciones realizadas sobre los mecanismos y modos de falla de los LEDs empleados en los sistemas de iluminación. Este artículo proporciona una base para comprender los problemas de confiabilidad de los LEDs, pues aún la información sobre confiabilidad proporcionada por los fabricantes de LEDs no es suficiente para los usuarios de esta tecnología.]]></p></abstract>
<abstract abstract-type="short" xml:lang="en"><p><![CDATA[ABSTRACT Due to the increasing use of LEDs in lighting systems, the LEDs reliability evaluation is a vitally important issue in the lighting industry, and consequently, the understanding of their failure mechanisms and failure modes are also. Although the construction process of LEDs is similar to other microelectronic devices, there are materials and functional requirements that make their failure modes and mechanisms different. This paper presents a review of research on the failure mechanisms and failure modes of LEDs used in lighting systems. This paper provides a basis for understanding the reliability issues of LEDs, as even the reliability information provided by LED manufacturers is not sufficient for users of this technology.]]></p></abstract>
<kwd-group>
<kwd lng="es"><![CDATA[LEDs empleados en iluminación]]></kwd>
<kwd lng="es"><![CDATA[Evaluación de confiabilidad]]></kwd>
<kwd lng="es"><![CDATA[Mecanismos de falla]]></kwd>
<kwd lng="es"><![CDATA[Modos de falla]]></kwd>
<kwd lng="es"><![CDATA[Fuentes de iluminación]]></kwd>
<kwd lng="en"><![CDATA[LEDs used in lighting]]></kwd>
<kwd lng="en"><![CDATA[Reliability assessment]]></kwd>
<kwd lng="en"><![CDATA[Failure mechanisms]]></kwd>
<kwd lng="en"><![CDATA[Failure modes]]></kwd>
<kwd lng="en"><![CDATA[Lighting sources]]></kwd>
</kwd-group>
</article-meta>
</front><back>
<ref-list>
<ref id="B1">
<label>1.</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Li]]></surname>
<given-names><![CDATA[J.]]></given-names>
</name>
</person-group>
<article-title xml:lang=""><![CDATA[Basic Principles of LED, en III-Nitrides Light Emitting Diodes]]></article-title>
<source><![CDATA[Technology and Applications]]></source>
<year>2020</year>
<volume>306</volume>
<page-range>7-18</page-range></nlm-citation>
</ref>
<ref id="B2">
<label>2.</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Li]]></surname>
<given-names><![CDATA[J.]]></given-names>
</name>
</person-group>
<article-title xml:lang=""><![CDATA[Introduction, en III-Nitrides Light Emitting Diodes]]></article-title>
<source><![CDATA[Technology and Applications]]></source>
<year>2020</year>
<volume>306</volume>
<page-range>1-5</page-range></nlm-citation>
</ref>
<ref id="B3">
<label>3.</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Li]]></surname>
<given-names><![CDATA[J.]]></given-names>
</name>
</person-group>
<article-title xml:lang=""><![CDATA[Applications of LEDs, en III-Nitrides Light Emitting Diodes]]></article-title>
<source><![CDATA[Technology and Applications]]></source>
<year>2020</year>
<page-range>229-51</page-range></nlm-citation>
</ref>
<ref id="B4">
<label>4.</label><nlm-citation citation-type="">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Vos]]></surname>
<given-names><![CDATA[T.]]></given-names>
</name>
<name>
<surname><![CDATA[den Breeijen]]></surname>
<given-names><![CDATA[P.]]></given-names>
</name>
<name>
<surname><![CDATA[van Driel]]></surname>
<given-names><![CDATA[W. D.]]></given-names>
</name>
</person-group>
<article-title xml:lang=""><![CDATA[Quality and Reliability in Solid-State Lighting: Qua Vadis?]]></article-title>
<source><![CDATA[Solid State Lighting Reliability Part 2: Components to Systems]]></source>
<year>2018</year>
<page-range>1-13</page-range></nlm-citation>
</ref>
<ref id="B5">
<label>5.</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Li]]></surname>
<given-names><![CDATA[J.]]></given-names>
</name>
</person-group>
<article-title xml:lang=""><![CDATA[Reliability Analysis of Group III Nitride LEDs Devices]]></article-title>
<source><![CDATA[III-Nitrides Light Emitting Diodes: Technology and Applications]]></source>
<year>2020</year>
<page-range>203-27</page-range></nlm-citation>
</ref>
<ref id="B6">
<label>6.</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Zhuang]]></surname>
<given-names><![CDATA[Y.]]></given-names>
</name>
</person-group>
<article-title xml:lang=""><![CDATA[Study on the mechanism of color coordinate shift of LED package]]></article-title>
<source><![CDATA[J. Semicond]]></source>
<year>2017</year>
<volume>38</volume>
<numero>7</numero>
<issue>7</issue>
<page-range>074006</page-range></nlm-citation>
</ref>
<ref id="B7">
<label>7.</label><nlm-citation citation-type="">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Hamon]]></surname>
<given-names><![CDATA[B.]]></given-names>
</name>
<name>
<surname><![CDATA[Merelle]]></surname>
<given-names><![CDATA[T.]]></given-names>
</name>
<name>
<surname><![CDATA[Bataillou]]></surname>
<given-names><![CDATA[B.]]></given-names>
</name>
</person-group>
<article-title xml:lang=""><![CDATA[LED Early Failures: Detection, Signature, and Related Mechanisms]]></article-title>
<source><![CDATA[Solid State Lighting Reliability Part 2: Components to Systems]]></source>
<year>2018</year>
<page-range>49-75</page-range></nlm-citation>
</ref>
<ref id="B8">
<label>8.</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Juárez]]></surname>
<given-names><![CDATA[M. A.]]></given-names>
</name>
</person-group>
<article-title xml:lang=""><![CDATA[Study of Light Degradation in High Power LEDs as a Function of the Feeding Wavefor, en 2020 IEEE International Autumn Meeting on Power]]></article-title>
<source><![CDATA[Electronics and Computing (ROPEC)]]></source>
<year>2020</year>
<volume>4</volume>
<page-range>1-6</page-range></nlm-citation>
</ref>
<ref id="B9">
<label>9.</label><nlm-citation citation-type="book">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Baillot]]></surname>
<given-names><![CDATA[R.]]></given-names>
</name>
<name>
<surname><![CDATA[Yannick]]></surname>
<given-names><![CDATA[Deshayes]]></given-names>
</name>
</person-group>
<source><![CDATA[Reliability Investigation of LED Devices for Public Light Applications]]></source>
<year>2017</year>
<edition>1st</edition>
<publisher-name><![CDATA[ISTE Press Ltd]]></publisher-name>
</nlm-citation>
</ref>
<ref id="B10">
<label>10.</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Königs]]></surname>
<given-names><![CDATA[S.]]></given-names>
</name>
<name>
<surname><![CDATA[Mayr]]></surname>
<given-names><![CDATA[S.]]></given-names>
</name>
<name>
<surname><![CDATA[Buchner]]></surname>
<given-names><![CDATA[A.]]></given-names>
</name>
</person-group>
<article-title xml:lang=""><![CDATA[LED-based light sources optimised for high colour rendition from an end users&#8217; perspective]]></article-title>
<source><![CDATA[Ergonomics]]></source>
<year>2021</year>
<volume>64</volume>
<numero>5</numero>
<issue>5</issue>
<page-range>671-83</page-range></nlm-citation>
</ref>
<ref id="B11">
<label>11.</label><nlm-citation citation-type="">
<collab>U.S. Department of Energy</collab>
<source><![CDATA[SSL Forecast Report]]></source>
<year>2017</year>
</nlm-citation>
</ref>
<ref id="B12">
<label>12.</label><nlm-citation citation-type="">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Mehr M.]]></surname>
<given-names><![CDATA[Yazdan]]></given-names>
</name>
<name>
<surname><![CDATA[van Driel]]></surname>
<given-names><![CDATA[W. D.]]></given-names>
</name>
<name>
<surname><![CDATA[Zhang]]></surname>
<given-names><![CDATA[G. Q.]]></given-names>
</name>
</person-group>
<article-title xml:lang=""><![CDATA[Reliability and Lifetime Assessment of Optical Materials in LED-Based Products]]></article-title>
<source><![CDATA[Solid State Lighting Reliability Part 2: Components to Systems]]></source>
<year>2018</year>
<page-range>115-39</page-range></nlm-citation>
</ref>
<ref id="B13">
<label>13.</label><nlm-citation citation-type="">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Zhang]]></surname>
<given-names><![CDATA[S.-U.]]></given-names>
</name>
</person-group>
<article-title xml:lang=""><![CDATA[Long-Term Reliability Prediction of LED Packages Using Numerical Simulation]]></article-title>
<source><![CDATA[Solid State Lighting Reliability Part 2: Components to Systems]]></source>
<year>2018</year>
<page-range>503-25</page-range></nlm-citation>
</ref>
<ref id="B14">
<label>14.</label><nlm-citation citation-type="">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Qian]]></surname>
<given-names><![CDATA[C.]]></given-names>
</name>
</person-group>
<article-title xml:lang=""><![CDATA[Advances in Reliability Testing and Standards Development for LED Packages and Systems]]></article-title>
<source><![CDATA[Solid State Lighting Reliability Part 2: Components to Systems]]></source>
<year>2018</year>
<page-range>77-114</page-range></nlm-citation>
</ref>
<ref id="B15">
<label>15.</label><nlm-citation citation-type="confpro">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Guang]]></surname>
<given-names><![CDATA[L.]]></given-names>
</name>
<name>
<surname><![CDATA[Guo]]></surname>
<given-names><![CDATA[L.]]></given-names>
</name>
<name>
<surname><![CDATA[Xiong]]></surname>
<given-names><![CDATA[Gan]]></given-names>
</name>
<name>
<surname><![CDATA[Bin]]></surname>
<given-names><![CDATA[Y.]]></given-names>
</name>
</person-group>
<source><![CDATA[Prognostics and Health Management Technology of LED Lamp]]></source>
<year>2018</year>
<conf-name><![CDATA[ 19thInternational Conference on Electronic Packaging Technology]]></conf-name>
<conf-loc> </conf-loc>
<page-range>1273-7</page-range></nlm-citation>
</ref>
<ref id="B16">
<label>16.</label><nlm-citation citation-type="">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Li]]></surname>
<given-names><![CDATA[J.]]></given-names>
</name>
</person-group>
<article-title xml:lang=""><![CDATA[III-Nitride LED Chip Fabrication Techniques]]></article-title>
<source><![CDATA[III-Nitrides Light Emitting Diodes: Technology and Applications]]></source>
<year>2020</year>
<page-range>151-83</page-range></nlm-citation>
</ref>
<ref id="B17">
<label>17.</label><nlm-citation citation-type="">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Li]]></surname>
<given-names><![CDATA[J.]]></given-names>
</name>
</person-group>
<article-title xml:lang=""><![CDATA[Packaging of Group-III Nitride LED]]></article-title>
<source><![CDATA[III-Nitrides Light Emitting Diodes: Technology and Applications, cap. 9]]></source>
<year>2020</year>
<page-range>185-202</page-range></nlm-citation>
</ref>
<ref id="B18">
<label>18.</label><nlm-citation citation-type="">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Fan]]></surname>
<given-names><![CDATA[J.]]></given-names>
</name>
</person-group>
<article-title xml:lang=""><![CDATA[Fault Diagnostics and Lifetime Prognostics for Phosphor-Converted White LED Packages]]></article-title>
<source><![CDATA[Solid State Lighting Reliability Part 2: Components to Systems]]></source>
<year>2018</year>
<page-range>255-99</page-range></nlm-citation>
</ref>
<ref id="B19">
<label>19.</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Sun]]></surname>
<given-names><![CDATA[B.]]></given-names>
</name>
</person-group>
<article-title xml:lang=""><![CDATA[A Review of Prognostic Techniques for High-Power White LEDs]]></article-title>
<source><![CDATA[IEEE Transactions on Power Electronics]]></source>
<year>2017</year>
<volume>32</volume>
<numero>8</numero>
<issue>8</issue>
<page-range>6338-62</page-range></nlm-citation>
</ref>
<ref id="B20">
<label>20.</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Iqbal]]></surname>
<given-names><![CDATA[F.]]></given-names>
</name>
<name>
<surname><![CDATA[Kim]]></surname>
<given-names><![CDATA[S.]]></given-names>
</name>
<name>
<surname><![CDATA[Kim]]></surname>
<given-names><![CDATA[H.]]></given-names>
</name>
</person-group>
<article-title xml:lang=""><![CDATA[Degradation of phosphor-in-glass encapsulants with various phosphor types for high power LEDs]]></article-title>
<source><![CDATA[Optical Materials]]></source>
<year>2017</year>
<volume>72</volume>
<page-range>323-9</page-range></nlm-citation>
</ref>
<ref id="B21">
<label>21.</label><nlm-citation citation-type="">
<person-group person-group-type="author">
<name>
<surname><![CDATA[De Santi]]></surname>
<given-names><![CDATA[C.]]></given-names>
</name>
</person-group>
<article-title xml:lang=""><![CDATA[Chip-Level Degradation of InGaN-Based Optoelectronic Devices]]></article-title>
<source><![CDATA[Solid State Lighting Reliability Part 2: Components to Systems]]></source>
<year>2018</year>
<page-range>15-48</page-range></nlm-citation>
</ref>
<ref id="B22">
<label>22.</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Ibrahim]]></surname>
<given-names><![CDATA[M. S.]]></given-names>
</name>
</person-group>
<article-title xml:lang=""><![CDATA[Lumen Degradation Lifetime Prediction for High-Power White LEDs Based on the Gamma Process Model]]></article-title>
<source><![CDATA[IEEE Photonics Journal]]></source>
<year>2019</year>
<volume>11</volume>
<numero>6</numero>
<issue>6</issue>
<page-range>1-16</page-range></nlm-citation>
</ref>
<ref id="B23">
<label>23.</label><nlm-citation citation-type="confpro">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Van Driel]]></surname>
<given-names><![CDATA[W. D.]]></given-names>
</name>
</person-group>
<source><![CDATA[Color maintenance prediction for LED-based products]]></source>
<year>2018</year>
<conf-name><![CDATA[ 19thInternational Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)]]></conf-name>
<conf-loc> </conf-loc>
<page-range>1-6</page-range></nlm-citation>
</ref>
<ref id="B24">
<label>24.</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Meneghesso]]></surname>
<given-names><![CDATA[G.]]></given-names>
</name>
<name>
<surname><![CDATA[Meneghini]]></surname>
<given-names><![CDATA[M.]]></given-names>
</name>
<name>
<surname><![CDATA[Zanoni]]></surname>
<given-names><![CDATA[E.]]></given-names>
</name>
</person-group>
<article-title xml:lang=""><![CDATA[Recent results on the degradation of white LEDs for lighting]]></article-title>
<source><![CDATA[. Phys. D: Appl. Phys]]></source>
<year>2010</year>
<volume>43</volume>
<numero>35</numero>
<issue>35</issue>
<page-range>354007</page-range></nlm-citation>
</ref>
<ref id="B25">
<label>25.</label><nlm-citation citation-type="">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Zhang]]></surname>
<given-names><![CDATA[J.]]></given-names>
</name>
<name>
<surname><![CDATA[G. Zhang]]></surname>
<given-names><![CDATA[Q.]]></given-names>
</name>
</person-group>
<article-title xml:lang=""><![CDATA[Advances in LED Solder Joint Reliability Testing and Prediction]]></article-title>
<source><![CDATA[Solid State Lighting Reliability Part 2: Components to Systems]]></source>
<year>2018</year>
<page-range>301-51</page-range></nlm-citation>
</ref>
<ref id="B26">
<label>26.</label><nlm-citation citation-type="">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Huang]]></surname>
<given-names><![CDATA[J.]]></given-names>
</name>
</person-group>
<article-title xml:lang=""><![CDATA[Degradation Mechanisms of Mid-power White-Light LEDs]]></article-title>
<source><![CDATA[Solid State Lighting Reliability Part 2: Components to Systems]]></source>
<year>2018</year>
<page-range>381-432</page-range></nlm-citation>
</ref>
<ref id="B27">
<label>27.</label><nlm-citation citation-type="">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Lienig]]></surname>
<given-names><![CDATA[Jens]]></given-names>
</name>
<name>
<surname><![CDATA[Thiele]]></surname>
<given-names><![CDATA[Matthias]]></given-names>
</name>
</person-group>
<source><![CDATA[Fundamentals of Electromigration-Aware Integrated Circuit Design]]></source>
<year>2022</year>
</nlm-citation>
</ref>
<ref id="B28">
<label>28.</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Yang]]></surname>
<given-names><![CDATA[H.]]></given-names>
</name>
<name>
<surname><![CDATA[Yang]]></surname>
<given-names><![CDATA[B.]]></given-names>
</name>
<name>
<surname><![CDATA[Li]]></surname>
<given-names><![CDATA[J.]]></given-names>
</name>
<name>
<surname><![CDATA[Yang]]></surname>
<given-names><![CDATA[P.]]></given-names>
</name>
</person-group>
<article-title xml:lang=""><![CDATA[Failure analysis and reliability reinforcement on gold wire in high-power COB-LED under current and thermal shock combined loading]]></article-title>
<source><![CDATA[Applied Thermal Engineering]]></source>
<year>2019</year>
<volume>150</volume>
<page-range>1046-53</page-range></nlm-citation>
</ref>
<ref id="B29">
<label>29.</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Trivellin]]></surname>
<given-names><![CDATA[N.]]></given-names>
</name>
</person-group>
<article-title xml:lang=""><![CDATA[Failures of LEDs in Real-World Applications: A Review]]></article-title>
<source><![CDATA[IEEE Transactions on Device and Materials Reliability]]></source>
<year>2018</year>
<volume>18</volume>
<numero>3</numero>
<issue>3</issue>
<page-range>391-6</page-range></nlm-citation>
</ref>
<ref id="B30">
<label>30.</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Cai]]></surname>
<given-names><![CDATA[M.]]></given-names>
</name>
</person-group>
<article-title xml:lang=""><![CDATA[Effects of silicone lens aging on degradation kinetics of light-emitting diode package in various accelerated testing]]></article-title>
<source><![CDATA[Optical Materials]]></source>
<year>2020</year>
<volume>107</volume>
<page-range>110071</page-range></nlm-citation>
</ref>
<ref id="B31">
<label>31.</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Fulmek]]></surname>
<given-names><![CDATA[P.]]></given-names>
</name>
</person-group>
<article-title xml:lang=""><![CDATA[On the impact of the temperature dependency of the phosphor quantum efficiency on correlated color temperature stability in phosphor converted LEDs]]></article-title>
<source><![CDATA[Materials Chemistry and Physics]]></source>
<year>2017</year>
<volume>196</volume>
<page-range>82-91</page-range></nlm-citation>
</ref>
<ref id="B32">
<label>32.</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Mehr]]></surname>
<given-names><![CDATA[M. Yazdan]]></given-names>
</name>
</person-group>
<article-title xml:lang=""><![CDATA[Degradation of optical materials in solid-state lighting systems]]></article-title>
<source><![CDATA[International Materials Reviews]]></source>
<year>2020</year>
<volume>65</volume>
<numero>2</numero>
<issue>2</issue>
<page-range>102-28</page-range></nlm-citation>
</ref>
<ref id="B33">
<label>33.</label><nlm-citation citation-type="">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Davis J.]]></surname>
<given-names><![CDATA[Lynn]]></given-names>
</name>
</person-group>
<article-title xml:lang=""><![CDATA[``Chromaticity Maintenance in LED Devices]]></article-title>
<source><![CDATA[Solid State Lighting Reliability Part 2: Components to Systems]]></source>
<year>2018</year>
<page-range>221-54</page-range></nlm-citation>
</ref>
<ref id="B34">
<label>34.</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Narendran]]></surname>
<given-names><![CDATA[N.]]></given-names>
</name>
</person-group>
<article-title xml:lang=""><![CDATA[Solid-state lighting: failure analysis of white LEDs]]></article-title>
<source><![CDATA[Journal of Crystal Growth]]></source>
<year>2004</year>
<volume>268</volume>
<numero>3-4</numero>
<issue>3-4</issue>
<page-range>449-56</page-range></nlm-citation>
</ref>
<ref id="B35">
<label>35.</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Allen]]></surname>
<given-names><![CDATA[S. C.]]></given-names>
</name>
<name>
<surname><![CDATA[Steckl]]></surname>
<given-names><![CDATA[A. J.]]></given-names>
</name>
</person-group>
<article-title xml:lang=""><![CDATA[A nearly ideal phosphor-converted white light-emitting diode]]></article-title>
<source><![CDATA[Applied Physics Letters]]></source>
<year>2008</year>
<volume>92</volume>
<numero>14</numero>
<issue>14</issue>
<page-range>143309</page-range></nlm-citation>
</ref>
<ref id="B36">
<label>36.</label><nlm-citation citation-type="book">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Khan]]></surname>
<given-names><![CDATA[T. Q.]]></given-names>
</name>
</person-group>
<source><![CDATA[LED Lighting: Technology and Perception]]></source>
<year>2015</year>
<page-range>520</page-range><publisher-name><![CDATA[John Wiley &amp; Sons]]></publisher-name>
</nlm-citation>
</ref>
<ref id="B37">
<label>37.</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Yanagisawa]]></surname>
<given-names><![CDATA[T.]]></given-names>
</name>
<name>
<surname><![CDATA[Kojima]]></surname>
<given-names><![CDATA[T.]]></given-names>
</name>
</person-group>
<article-title xml:lang=""><![CDATA[Long-term accelerated current operation of white light-emitting diodes]]></article-title>
<source><![CDATA[Journal of Luminescence]]></source>
<year>2005</year>
<volume>114</volume>
<numero>1</numero>
<issue>1</issue>
<page-range>39-42</page-range></nlm-citation>
</ref>
<ref id="B38">
<label>38.</label><nlm-citation citation-type="">
<collab>IES standars Committe</collab>
<source><![CDATA[ANSI/IES LM-80-20 - Measuring Luminous Flux and Color Maintenance of LED Packages, Arrays, and Modules]]></source>
<year>2020</year>
</nlm-citation>
</ref>
<ref id="B39">
<label>39.</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Singh]]></surname>
<given-names><![CDATA[P.]]></given-names>
</name>
<name>
<surname><![CDATA[Tan]]></surname>
<given-names><![CDATA[C. M.]]></given-names>
</name>
</person-group>
<article-title xml:lang=""><![CDATA[Time evolution of packaged LED lamp degradation in outdoor applications]]></article-title>
<source><![CDATA[Optical Materials]]></source>
<year>2018</year>
<volume>86</volume>
<page-range>148-54</page-range></nlm-citation>
</ref>
<ref id="B40">
<label>40.</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Nair]]></surname>
<given-names><![CDATA[G. B.]]></given-names>
</name>
<name>
<surname><![CDATA[Swart]]></surname>
<given-names><![CDATA[H. C.]]></given-names>
</name>
<name>
<surname><![CDATA[Dhoble]]></surname>
<given-names><![CDATA[S. J.]]></given-names>
</name>
</person-group>
<article-title xml:lang=""><![CDATA[A review on the advancements in phosphor-converted light emitting diodes (pc-LEDs): Phosphor synthesis, device fabrication and characterization]]></article-title>
<source><![CDATA[Progress in Materials Science]]></source>
<year>2020</year>
<volume>109</volume>
<page-range>100622</page-range></nlm-citation>
</ref>
<ref id="B41">
<label>41.</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Singh]]></surname>
<given-names><![CDATA[P.]]></given-names>
</name>
<name>
<surname><![CDATA[Tan]]></surname>
<given-names><![CDATA[C. M.]]></given-names>
</name>
</person-group>
<article-title xml:lang=""><![CDATA[Degradation Physics of High Power LEDs in Outdoor Environment and the Role of Phosphor in the degradation process]]></article-title>
<source><![CDATA[Sci Rep]]></source>
<year>2016</year>
<volume>6</volume>
<numero>1</numero>
<issue>1</issue>
<page-range>1-13</page-range></nlm-citation>
</ref>
<ref id="B42">
<label>42.</label><nlm-citation citation-type="confpro">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Becirovic]]></surname>
<given-names><![CDATA[V.]]></given-names>
</name>
</person-group>
<source><![CDATA[Effects on LEDs during the Accelerated Ageing Test]]></source>
<year>2019</year>
<conf-name><![CDATA[ 18thInternational Symposium INFOTEH-JAHORINA (INFOTEH)]]></conf-name>
<conf-loc> </conf-loc>
<page-range>1-6</page-range></nlm-citation>
</ref>
<ref id="B43">
<label>43.</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Ke]]></surname>
<given-names><![CDATA[H.]]></given-names>
</name>
</person-group>
<article-title xml:lang=""><![CDATA[Study on the chromaticity of LED lamps given by online test during accelerated aging under thermal stress]]></article-title>
<source><![CDATA[Optik]]></source>
<year>2018</year>
<volume>164</volume>
<page-range>510-8</page-range></nlm-citation>
</ref>
<ref id="B44">
<label>44.</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Law]]></surname>
<given-names><![CDATA[T. K.]]></given-names>
</name>
<name>
<surname><![CDATA[Lim]]></surname>
<given-names><![CDATA[F.]]></given-names>
</name>
</person-group>
<article-title xml:lang=""><![CDATA[A Practical Degradation Based Method to Predict Long-Term Moisture Incursion and Color Change in High Power LEDs]]></article-title>
<source><![CDATA[IEEE Photonics Journal]]></source>
<year>2018</year>
<volume>10</volume>
<numero>5</numero>
<issue>5</issue>
<page-range>1-14</page-range></nlm-citation>
</ref>
<ref id="B45">
<label>45.</label><nlm-citation citation-type="confpro">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Fan]]></surname>
<given-names><![CDATA[J.]]></given-names>
</name>
</person-group>
<source><![CDATA[Fatigue Damage Assessment of LED Chip Scale Packages with Finite Element Simulation]]></source>
<year>2018</year>
<conf-name><![CDATA[ 19thInternational Conference on Electronic Packaging Technology (ICEPT)]]></conf-name>
<conf-loc> </conf-loc>
<page-range>1642-8</page-range></nlm-citation>
</ref>
<ref id="B46">
<label>46.</label><nlm-citation citation-type="">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Lu]]></surname>
<given-names><![CDATA[G.]]></given-names>
</name>
</person-group>
<article-title xml:lang=""><![CDATA[``LED-Based Luminaire Color Shift Acceleration and Prediction]]></article-title>
<source><![CDATA[Solid State Lighting Reliability Part 2: Components to Systems]]></source>
<year>2018</year>
<page-range>201-19</page-range></nlm-citation>
</ref>
<ref id="B47">
<label>47.</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Schuld]]></surname>
<given-names><![CDATA[M.]]></given-names>
</name>
<name>
<surname><![CDATA[van Driel]]></surname>
<given-names><![CDATA[W. D.,]]></given-names>
</name>
<name>
<surname><![CDATA[Jacobs]]></surname>
<given-names><![CDATA[B.]]></given-names>
</name>
</person-group>
<article-title xml:lang=""><![CDATA[Statistical Analysis of Lumen Depreciation for LED Packages]]></article-title>
<source><![CDATA[Solid State Lighting Reliability Part 2: Components to Systems]]></source>
<year>2018</year>
<page-range>487-502</page-range></nlm-citation>
</ref>
<ref id="B48">
<label>48.</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Yang]]></surname>
<given-names><![CDATA[X.]]></given-names>
</name>
</person-group>
<article-title xml:lang=""><![CDATA[An Alternative Lifetime Model for White Light Emitting Diodes under Thermal-Electrical Stresses]]></article-title>
<source><![CDATA[Materials]]></source>
<year>2018</year>
<volume>11</volume>
<numero>5</numero>
<issue>5</issue>
</nlm-citation>
</ref>
<ref id="B49">
<label>49.</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Huo]]></surname>
<given-names><![CDATA[J.]]></given-names>
</name>
</person-group>
<article-title xml:lang=""><![CDATA[Efficient Energy Transfer from Trap Levels to Eu3+ Leads to Antithermal Quenching Effect in High-Power White Light-Emitting Diodes]]></article-title>
<source><![CDATA[Inorg. Chem.]]></source>
<year>2020</year>
<volume>59</volume>
<numero>20</numero>
<issue>20</issue>
<page-range>15514-25</page-range></nlm-citation>
</ref>
<ref id="B50">
<label>50.</label><nlm-citation citation-type="journal">
<person-group person-group-type="author">
<name>
<surname><![CDATA[Gurskii]]></surname>
<given-names><![CDATA[A. L.]]></given-names>
</name>
<name>
<surname><![CDATA[Masheda]]></surname>
<given-names><![CDATA[M. V.]]></given-names>
</name>
</person-group>
<article-title xml:lang=""><![CDATA[Color and Spectral Characteristics of White Light Emitting Diodes and Their Variation During Aging]]></article-title>
<source><![CDATA[&#1044;&#1086;&#1082;&#1083;&#1072;&#1076;&#1099; &#1041;&#1077;&#1083;&#1086;&#1088;&#1091;&#1089;&#1089;&#1082;&#1086;&#1075;&#1086; &#1043;&#1086;&#1089;&#1091;&#1076;&#1072;&#1088;&#1089;&#1090;&#1074;&#1077;&#1085;&#1085;&#1086;&#1075;&#1086; &#1059;&#1085;&#1080;&#1074;&#1077;&#1088;&#1089;&#1080;&#1090;&#1077;&#1090;&#1072; &#1048;&#1085;&#1092;&#1086;&#1088;&#1084;&#1072;&#1090;&#1080;&#1082;&#1080; &#1048; &#1056;&#1072;&#1076;&#1080;&#1086;&#1101;&#1083;&#1077;&#1082;&#1090;&#1088;&#1086;&#1085;&#1080;&#1082;&#1080;]]></source>
<year>2019</year>
<volume>S7</volume>
<numero>125</numero>
<issue>125</issue>
</nlm-citation>
</ref>
</ref-list>
</back>
</article>
