<?xml version="1.0" encoding="ISO-8859-1"?><article xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance">
<front>
<journal-meta>
<journal-id>1815-5901</journal-id>
<journal-title><![CDATA[Ingeniería Energética]]></journal-title>
<abbrev-journal-title><![CDATA[Energética]]></abbrev-journal-title>
<issn>1815-5901</issn>
<publisher>
<publisher-name><![CDATA[Universidad Tecnológica de La Habana José Antonio Echeverría, Cujae]]></publisher-name>
</publisher>
</journal-meta>
<article-meta>
<article-id>S1815-59012020000100008</article-id>
<title-group>
<article-title xml:lang="es"><![CDATA[Distribuciones probabilísticas no tradicionales para el estudio de la confiabilidad de LEDs empleados en iluminación]]></article-title>
<article-title xml:lang="en"><![CDATA[Non-traditional probabilistic distributions for reliability study of LEDs used in lighting]]></article-title>
</title-group>
<contrib-group>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Fernández Labrada]]></surname>
<given-names><![CDATA[Diego de los Angeles]]></given-names>
</name>
<xref ref-type="aff" rid="Aff"/>
</contrib>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Castro Fernandez]]></surname>
<given-names><![CDATA[Miguel]]></given-names>
</name>
<xref ref-type="aff" rid="Aff"/>
</contrib>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Guerra Blanco]]></surname>
<given-names><![CDATA[Ernesto Alejandro]]></given-names>
</name>
<xref ref-type="aff" rid="Aff"/>
</contrib>
<contrib contrib-type="author">
<name>
<surname><![CDATA[Fernández Martínez]]></surname>
<given-names><![CDATA[Degnis]]></given-names>
</name>
<xref ref-type="aff" rid="Aff"/>
</contrib>
</contrib-group>
<aff id="Af1">
<institution><![CDATA[,Universidad Tecnológica de La Habana José A. Echeverría  ]]></institution>
<addr-line><![CDATA[ La Habana]]></addr-line>
<country>Cuba</country>
</aff>
<aff id="Af2">
<institution><![CDATA[,Ministerio de la Industria Alimentaria  ]]></institution>
<addr-line><![CDATA[ La Habana]]></addr-line>
<country>Cuba</country>
</aff>
<pub-date pub-type="pub">
<day>00</day>
<month>04</month>
<year>2020</year>
</pub-date>
<pub-date pub-type="epub">
<day>00</day>
<month>04</month>
<year>2020</year>
</pub-date>
<volume>41</volume>
<numero>1</numero>
<copyright-statement/>
<copyright-year/>
<self-uri xlink:href="http://scielo.sld.cu/scielo.php?script=sci_arttext&amp;pid=S1815-59012020000100008&amp;lng=en&amp;nrm=iso"></self-uri><self-uri xlink:href="http://scielo.sld.cu/scielo.php?script=sci_abstract&amp;pid=S1815-59012020000100008&amp;lng=en&amp;nrm=iso"></self-uri><self-uri xlink:href="http://scielo.sld.cu/scielo.php?script=sci_pdf&amp;pid=S1815-59012020000100008&amp;lng=en&amp;nrm=iso"></self-uri><abstract abstract-type="short" xml:lang="es"><p><![CDATA[RESUMEN Debido al incremento del uso de la tecnología LED ( Light Emitting Diode ) y a la complejidad de sus modos y mecanismos de falla, su confiabilidad resulta un tema clave de investigación. Para realizar estudios de confiabilidad, la distribución de Weibull es generalmente la más empleada, pero en los LEDs, como estos se degradan continuamente, dicha distribución podría no funcionar con la misma eficacia. Este artículo muestra el procedimiento para la obtención de modelos de confiabilidad de LEDs blancos empleados en iluminación, a partir de distribuciones de probabilidad no tradicionales de &#8220;tiempos hasta el fallo&#8221; obtenidos, según criterio     L  70 de ASSIST, en ensayos acelerados de la literatura consultada. Los análisis realizados con los &#8220;tiempos hasta el fallo&#8221; mostraron que no hay evidencia suficiente para rechazar que los datos siguen la distribución de Weibull-Exponencial Generalizada (WGED) y la distribución Modificada de Weibull (MWD), según la Prueba de Bondad de Ajuste Kolmogorov-Smirnov.]]></p></abstract>
<abstract abstract-type="short" xml:lang="en"><p><![CDATA[ABSTRACT Due to the increased use of LED technology and the complexity of its modes and failure mechanisms, its reliability is a key research issue. To carry out reliability studies based on accelerated test data, the Weibull distribution is generally the most widely used; but in the LEDs, as these are degraded continuously, this distribution may not work with the same efficacy. This paper shows the procedure for obtaining reliability models of white LEDs used in lighting, from non-traditional probability distributions of "times to failure" obtained, according to the criterion     L  70 of ASSIST, from accelerated testing of the consulted literature. The analyzes carried out with the &#8220;times to failure&#8221; showed that there is insufficient evidence to reject that the data follow the distributions of Weibull-Exponential Generalized(WGED) and Modified Weibull(MWD), according to the Kolmogorov-Smirnov Test.]]></p></abstract>
<kwd-group>
<kwd lng="es"><![CDATA[LEDs blancos]]></kwd>
<kwd lng="es"><![CDATA[Análisis de Confiabilidad]]></kwd>
<kwd lng="es"><![CDATA[Ensayos Acelerados]]></kwd>
<kwd lng="es"><![CDATA[Distribuciones no tradicionales de probabilidad]]></kwd>
<kwd lng="es"><![CDATA[tiempo de vida]]></kwd>
<kwd lng="en"><![CDATA[White LEDs]]></kwd>
<kwd lng="en"><![CDATA[Reliability Analysis]]></kwd>
<kwd lng="en"><![CDATA[Accelerated Test]]></kwd>
<kwd lng="en"><![CDATA[non-traditional probability distributions]]></kwd>
<kwd lng="en"><![CDATA[lifetime]]></kwd>
</kwd-group>
</article-meta>
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