Abstract

GONZALEZ RIOS, Jorge L.; CRUZ HURTADO, Juan C.; MORENO, Robson L.  and  VAZQUEZ, Diego. Variability-aware design of integrated low-noise amplifiers. EAC [online]. 2016, vol.37, n.1, pp. 1-8. ISSN 1815-5928.

This work analyzes the statistical behavior under process and mismatch variations of various 130-nm/1.2-V CMOS low-noise amplifiers (LNAs). The effects of LNAs’ parameters degradation on receiver’s performance are also analyzed. Amplifiers using different channel-length transistors and biasing-current values are studied. Monte Carlo simulations show that using longer-channel transistors and increasing power consumption enhance receiver’s yield. Gain drop arises as the LNA parameter with highest impact on receiver failure. These results confirm the necessity of including variability analysis into conventional design methodologies, in order to trade power consumption and production cost.

Keywords : low-noise amplifier (LNA); integrated circuit; CMOS; process and mismatch variations; low power; radiofrequency (RF).

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